EC -- Index by Author (Apr 2009; Volume 8, Number 4)

Index by Author: Apr 2009; 8 (4) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Anderson, Amy C. [Abstract] [Full Text]; Asfaw, Yohannes G. [Abstract] [Full Text]
B: Bairwa, Narendra K. [Abstract] [Full Text]; Bartholomew, Clinton R. [Abstract] [Full Text]; Bastia, Deepak [Abstract] [Full Text]; Beaudoin, Jude [Abstract] [Full Text]; Beck, James M. [Full Text]; Blackman, Michael J. [Abstract] [Full Text]; Bolstad, David B. [Abstract] [Full Text]; Bolstad, Erin S. D. [Abstract] [Full Text]; Botts, Michael R. [Abstract] [Full Text]; Braus, Gerhard H. [Abstract] [Full Text]; Burns, Patrick B. [Abstract] [Full Text]; Butler, Geraldine [Abstract] [Full Text]; Bzik, David J. [Abstract] [Full Text]
C: Cali, Ann [Full Text]; Cama, Vitaliano [Abstract] [Full Text]; Carruthers, Vern B. [Abstract] [Full Text]; Cheng, Shaoji [Abstract] [Full Text]; Clancy, Cornelius J. [Abstract] [Full Text]; Cramer, Robert A., Jr. [Abstract] [Full Text]; Cushion, Melanie T. [Full Text]
D: d'Enfert, Christophe [Abstract] [Full Text]; Davidson, Lindsay [Abstract] [Full Text]; Dearen, Theresa [Abstract] [Full Text]; Dei-Cas, Eduardo [Full Text]; Didier, Elizabeth S. [Full Text]; Ding, Chen [Abstract] [Full Text]
E: Engelmann, Sabine [Abstract] [Full Text]
F: Feng, Yaoyu [Abstract] [Full Text]; Ferguson, Michael A. J. [Abstract] [Full Text]; Fortwendel, Jarrod R. [Abstract] [Full Text]; Fox, Barbara A. [Abstract] [Full Text]; Frydlová, Ivana [Abstract] [Full Text]
G: Gates, Marcellene A. [Abstract] [Full Text]; Gigley, Jason P. [Abstract] [Full Text]; Giles, Steven S. [Abstract] [Full Text]; Guida, Alessandro [Abstract] [Full Text]
H: Ha-Ngoc, Tin [Abstract] [Full Text]; Halonen, Sandra K. [Full Text]; Hao, Binghua [Abstract] [Full Text]; Hardy, Christopher F. J. [Abstract] [Full Text]; Hasek, Jirí [Abstract] [Full Text]; Heitman, Joseph [Abstract] [Full Text]; Herzog, Britta [Abstract] [Full Text]; Higgins, Desmond G. [Abstract] [Full Text]; Hull, Christina M. [Abstract] [Full Text]; Huynh, My-Hang [Abstract] [Full Text]
I: Iczkowski, Kenneth A. [Abstract] [Full Text]
J: Jbel, Mehdi [Abstract] [Full Text]; Juvvadi, Praveen Rao [Abstract] [Full Text]
K: Kaneshiro, Edna S. [Full Text]; Kang, Gagandeep [Abstract] [Full Text]; Khan, Wasif [Abstract] [Full Text]; Kim, Kami [Abstract] [Full Text]; Kozel, Thomas R. [Abstract] [Full Text]
L: Labbé, Simon [Abstract] [Full Text]; Lamont, Douglas [Abstract] [Full Text]; Liu, Jieying [Abstract] [Full Text]
M: Madhani, Hiten D. [Abstract] [Full Text]; Malcová, Ivana [Abstract] [Full Text]; Marciano-Cabral, Francine [Full Text]; Matuschewski, Kai [Abstract] [Full Text]; Mercier, Alexandre [Abstract] [Full Text]; Mohanty, Bidyut K. [Abstract] [Full Text]; Mulder, Harm J. [Abstract] [Full Text]
N: Nett, Isabelle R. E. [Abstract] [Full Text]; Nguyen, M. Hong [Abstract] [Full Text]; Nikolaev, Igor [Abstract] [Full Text]
O: O'Connor, Roberta M. [Abstract] [Full Text]; O'Connor, Roberta M. [Abstract] [Full Text]; Osmani, Stephen A. [Abstract] [Full Text]
P: Pelletier, Benoit [Abstract] [Full Text]; Perfect, B. Zachary [Abstract] [Full Text]; Perfect, John R. [Abstract] [Full Text]; Pinchai, Nadthanan [Abstract] [Full Text]
R: Raman, Suresh B. [Abstract] [Full Text]; Ristuccia, Jessica G. [Abstract] [Full Text]; Rossignol, Tristan [Abstract] [Full Text]
S: Sakai, Yasuyoshi [Abstract] [Full Text]; Scarpato, Kristen [Abstract] [Full Text]; Scholz, Eva [Abstract] [Full Text]; Schulze, Florian [Abstract] [Full Text]; Shock, Teresa R. [Abstract] [Full Text]; Silvie, Olivier [Abstract] [Full Text]; Son, Sunghun [Abstract] [Full Text]; Steinbach, William J. [Abstract] [Full Text]; Streckfuss-Bömeke, Katrin [Abstract] [Full Text]
T: Takigami, Emiko [Abstract] [Full Text]; Techasintana, Patsharaporn [Abstract] [Full Text]; Thompson, James [Abstract] [Full Text]
V: Vasicová, Pavla [Abstract] [Full Text]
W: Wanyiri, Jane W. [Abstract] [Full Text]; Ward, Honorine [Abstract] [Full Text]; Ward, Honorine D. [Abstract] [Full Text]; Weiss, Louis M. [Full Text]; Weiss, Louis M. [Full Text]; Wright, Dennis L. [Abstract] [Full Text]
X: Xiao, Lihua [Abstract] [Full Text]; Xiao, Lihua [Full Text]
Y: Yano, Taisuke [Abstract] [Full Text]; Yates, John R., III [Abstract] [Full Text]; Yurimoto, Hiroya [Abstract] [Full Text]